The HP/Agilent 6631B is an 80-watt single-output DC power supply engineered for production test automation and demanding measurement applications. It delivers 0 to 8V and 0 to 10A with voltage programming accuracy of ±5 mV and sub-millisecond response times, making it suitable for high-speed, precision-driven test environments. Built-in GPIB and RS-232 interfaces combined with SCPI command support enable seamless integration into automated test systems.
Technical Specifications
Output:
• Voltage: 0–8 V
• Current: 0–10 A
• Power: 80 W
Programming & Measurement Accuracy (25°C ±5°C):
• Voltage: ±5 mV
• Current: ±0.05% + 4 mA
• Load regulation (voltage/current): ±2 mV / ±2 mA
• Line regulation (voltage/current): ±0.5 mV / ±1 mA
Ripple & Noise (20 Hz to 20 MHz):
• Normal mode: 0.3 mV rms / 3 mV peak-to-peak
• Fast mode: 1 mV rms / 10 mV peak-to-peak
• Current noise: 3 mA rms
Dynamic Performance:
• Command processing: <4 ms (GPIB, display disabled)
• Voltage programming response: <2 ms; <400 µs in fast mode
• Voltage settling: <6 ms (normal) / <2 ms (fast mode)
• Measurement time: 50 ms average
• Active downprogrammer: Full rated current sink capability
Physical:
• Dimensions: 425.5 mm W × 88.1 mm H × 364.4 mm D
• Net weight: 12.7 kg
• Optional rack-mount kits available
– Key Features
• Microamp-level output current measurement resolution
• GPIB (HP-IB) and RS-232 programming interfaces with VXI Plug&Play driver support
• SCPI command compatibility for standardized instrument control
• Class I safety classification with protective earth terminal
• AC input options: 104–127 Vac, 191–233 Vac, or 207–253 Vac (47–63 Hz); full-load input: 250 W
• Front-panel binding post option available
– Typical Applications
Automated production test, component characterization, circuit validation, and precision DC source applications requiring fast programming, low noise, and accurate sub-milliamp current monitoring.
– Compatibility & Integration
Standard GPIB and RS-232 interfaces with native SCPI support and VXI Plug&Play drivers simplify integration into multi-instrument test systems and ATE environments.
