The HP/Agilent 6632B is a 100 W single-output linear-regulated DC power supply engineered for automated test equipment (ATE), component characterization, and precision measurement applications. This medium-power system balances benchtop accessibility with instrument-grade performance, delivering programmable voltage and current outputs with dual-range precision measurement capability. Fast transient response, active down-programming, and two-quadrant operation make it suitable for high-throughput manufacturing test and design validation.
Technical Specifications
Output Ratings
• Voltage: 0 to 20 V DC
• Current: 0 to 5 A
• Power: 100 W
Regulation and Accuracy
• Line regulation: 0.5 mV voltage, 1 mA current
• Load regulation: 2 mV voltage, 1 mA current
• Programming accuracy (25°C ± 5°C): 10 mV voltage (5 mV for 8 V range), 0.05% + 2 mA current
• Measurement accuracy (25°C ± 5°C): 0.03% + 2 mV voltage, 3 mV for 20 V range
• Ripple and noise (20 Hz to 20 MHz): 0.3 mV RMS / 3 mV peak-to-peak normal mode; 1 mV RMS / 10 mV peak-to-peak fast mode; 2 mA current RMS
• Transient settling: within 6 ms (2 ms fast mode) to within 0.025% × rated voltage
Measurement
• Dual-range low-current measurement to microampere resolution
• Built-in digital voltmeter and precision current shunt
• Average measurement time: 50 ms per voltage or current reading
• Readback over GPIB
– Key Features
• Programmable voltage and current via GPIB or front panel
• Active down-programmer sinks full rated current for rapid zero-volt discharge
• Two-quadrant operation: source and sink capability across full range
• SCPI command support with legacy HP/Agilent compatibility mode
• Stored states and status reporting
• Overvoltage and overcurrent protection
– Interfaces and Configuration
• GPIB (IEEE-488) and RS-232 connectivity
• Optional front panel binding posts (Option 020)
• Optional relay module for system integration (Option 760)
• Input voltage options: 87–106 VAC, 104–127 VAC, 191–233 VAC, or 207–253 VAC (47–63 Hz)
– Typical Applications
Component evaluation, device characterization, power supply testing, ATE integration, and development lab measurement.
