The Interface Technology SR5030A is a Variable Voltage I/O Module purpose-built for the SR5000 Digital Test Subsystem, delivering 16 independent input and 16 independent output channels with programmable voltage levels. Operating at 50 MHz with 100 ps edge placement resolution, the module supports dual pattern generation modes—RAM-backed and algorithmic—across 64K vectors per channel. It accommodates five output data formats: NRZ, RZ, RONE, RTC, and RI, with real-time stimulus, response, and compare capabilities.
## Technical Specifications
• **Data Rate:** 50 MHz
• **Vector Depth:** 64K vectors per channel
• **Edge Placement Resolution:** 100 ps
• **Timing Generators:** 10 per module
• **I/O Channels:** 16 input pins, 16 output pins
• **Programmable Levels:** 4 per module (input and output)
• **Voltage Range:** ±12 V
• **Input Threshold Range:** −12 V to +12 V
• **Threshold Resolution:** 0.01 V
• **Threshold Absolute Accuracy:** 0.1 V
• **Input Hysteresis:** 60 mV p-p (typical)
• **Input Resistance:** 30 kΩ typical to threshold
• **Input Termination:** Jumper selectable—none or 50 Ω
• **Output Data Formats:** NRZ, RZ, RONE, RTC, RI
• **Total Power Consumption:** 111.6 W (maximum)
## Key Features
• Variable threshold input receivers span the full ±12 V range with 0.01 V resolution and 0.1 V absolute accuracy
• Configurable input termination—jumper selectable between high impedance and 50 Ω
• Dual pattern generation architecture supports both memory-backed and algorithmic pattern modes
• Four independent programmable voltage levels enable multi-level stimulus and response operations
• Real-time compare functionality for inline test response validation
## Typical Applications
• Industrial automation and process control test integration
• Multi-level digital device stimulus and response characterization
• Sensor and actuator interface verification in automated test environments
• Mixed-signal pattern generation and capture across wide voltage ranges
## Compatibility & Integration
The SR5030A integrates as a single C-size module within the SR5000 Digital Test Subsystem architecture. The SR5000 platform supports mixed I/O module configurations, including the SR5030A (Variable Voltage I/O) and SR5031A (Programmable HV I/O) in multi-slot deployments.
