The Keithley 2600-PCT-1B Low Power Parametric Curve Tracer is a specialized instrument for comprehensive electrical characterization of semiconductor devices and electronic components. It integrates source-measure capabilities with curve tracing functionality to deliver precise analysis of voltage, current, resistance, and capacitance across MOSFETs, IGBTs, BJTs, diodes, and wide-bandgap devices. The system operates in two modes—Trace Mode for real-time parameter checking and Parametric Test Mode for precise extraction—enabling both development validation and production testing workflows.
Technical Specifications
• Voltage Range: µV to 3 kV
• Current Range: fA to 100 A
• High Voltage Mode: 200 V / 10 A
• High Current Mode: 200 V / 10 A
• Digitization: 24-bit A/D converters and high-speed 18-bit digitizers
• C-V Measurement: fF to µF capacitance; 2-, 3-, and 4-terminal device support; DC bias to 3 kV; test frequencies 10 kHz to 2 MHz (with PCT-CVU)
• On-State Current: DC ±20 A standard; pulsed ±50 A; optional ±40 A / ±100 A
• Drain/Collector Leakage: ±20 mA @ 3000 V
• Gate/Base Leakage: ±1 A or ±10 A pulsed
• Threshold Voltage: Up to ±200 V
• Forward Transfer Measurement: 1 ms to 1000 s pulse widths
• Capacitance Measurements: Ciss, Coss, Crss @ 100 kHz
– Key Features
• Measures breakdown voltage (Bvdss, Bvceo), on-state voltage (Vdson, Vcesat, Vf), and on-state resistance (RDS(on))
• Supports power semiconductors including GaN and SiC devices, plus LDMOS, triacs, and passive components
• Compatible with HV triax, SHV coax, and standard triax probe types
• Field upgradable to reliability or wafer sort tester configurations
• Requires Windows XP/7 PC with USB connectivity; ACS Basic Edition Software provides test libraries and full parametric control
– Typical Applications
• Power semiconductor device characterization and testing
• Parameter extraction for device modeling and reliability assessment
• Wafer-level and package-level qualification
– Compatibility & Integration
Works with standard probe stations and high-performance test fixtures supporting multiple package types.
