The Keithley 2602 is a dual-channel SourceMeter instrument combining precision sourcing and measurement capabilities in a single benchtop unit. It functions as a four-quadrant source and sink with integrated power supply, current source, voltmeter, and ammeter for comprehensive I-V characterization. With 6½-digit measurement resolution and programming resolution down to 5 µV / 1 pA, it delivers accuracy and speed for automated test environments from R&D through production.
Technical Specifications
Sourcing Performance
• Voltage sourcing: 1 µV to 40.4 V with 5 µV programming resolution
• Voltage accuracy: 0.02% + 250 µV (100 mV range) to 0.02% + 12 mV (40 V range)
• Current sourcing: 1 pA to 3.03 A DC; pulse capability to 10 A
• Current programming resolution: 1 pA; minimum pulse width 100 µs
• Output noise: <25 mV peak-peak (10 Hz–20 MHz, resistive load)
• Transient recovery: <70 µs to 0.1% for 10%–90% load step
• Maximum output power: 40 W per channel
Measurement Capabilities
• Voltage measurement: 1 µV to 40.8 V, 1 µV resolution
• Current measurement: 1 pA to 3.06 A DC; pulse to 10 A, 1 pA resolution
• Four-quadrant operation with bipolar current limiting (10 nA minimum)
• Overshoot: <±(0.1% + 10 mV)
System Configuration
• Dual independent channels
• Floating output to ±250 VDC
• Power supply: 100–250 VAC, 50–60 Hz (auto-sensing); 240 VA maximum consumption
• Physical: 89 mm H × 213 mm W × 460 mm D; 5.50 kg
– Key Features
• Two fully independent measurement and sourcing channels for parallel testing
• Sink operation in quadrants II and IV for power dissipation
• Digital I/O via 25-pin D-sub with 14 open-drain bits (±5.25 V / –0.25 V)
• TSP-Link expansion interface for multi-unit configurations
– Interfaces & Integration
Ethernet (LXI-C), IEEE-488 (GPIB), USB 2.0, and RS-232 connectivity enable integration into ATE systems and remote operation. TSP-Link supports daisy-chain expansion of multiple instruments.
– Typical Applications
I-V characterization of semiconductors, optoelectronic devices, and power components; precision sourcing for material research; device threshold and leakage current measurement; production parametric testing requiring low-current and high-voltage accuracy.
