The Keysight (Agilent) 4195A is a multi-function analyzer that combines network, spectrum, and impedance measurement capabilities in a single instrument. Operating from 10 Hz to 500 MHz, it delivers integrated characterization for linear and non-linear analog devices, circuits, and systems across R&D, manufacturing, and service environments.
Technical Specifications
Network Analysis
• Frequency range: 10 Hz to 500 MHz with 1 mHz resolution
• Output power: −50 dBm to +15 dBm (0.1 dB resolution)
• DC bias: ±40 V at 10 mV resolution
• Measurement range: −135 dBm to +20 dBm
• Magnitude ratio accuracy: ±1.0 dB @ 50 MHz; linearity ±0.1 dB (−40 to 0 dB), ±0.2 dB (−60 to −40 dB)
• Phase measurement: ±180° with 0.01° resolution
• Delay measurement: 10 ps to 500 s
• Two independent source outputs; dual or four-input configurations available
• Sweep modes: Linear, log, CW, program, and partial sweeps across frequency, power, and DC bias
• Calibration: Normalization, 1-port partial, 1-port full, and port extension error compensation
Spectrum Analysis
• Frequency range: 10 Hz to 500 MHz
• Resolution bandwidth: 3 Hz to 300 kHz (1-3-10 step)
• Selectivity (60/3 dB): 4.5 (3–30 Hz), 9 (100 Hz–10 kHz), 8.5 (30–300 kHz)
• Noise sideband: <−100 dBc/Hz @ 1 kHz offset; <−90 dBc/Hz @ 100 Hz offset
• Second harmonic distortion: ≤−70 dBc @ ≥2 MHz
• Third-order intercept: ≤−80 dBc @ ≥2 MHz
• Average noise: typically −140 dBm @ 10 Hz RBW, ≥2 MHz
• Amplitude range: −135 dBm to +20 dBm (±1.0 dB accuracy @ 50 MHz)
Impedance Analysis
• Automatic derivation from S-parameters
• Direct measurement: 100 kHz to 500 MHz (with optional 41951A test kit)
General
• 50 Ω nominal impedance; input damage level +30 dBm
• 0–50 dB attenuator (10 dB steps)
• Color CRT display with built-in 3.5-inch disk storage for instrument state, data, and user functions
– Typical Applications
Component characterization, filter analysis, amplifier S-parameter measurement, impedance profiling, harmonic and intermodulation distortion assessment, and broadband system validation.
