The Keysight B1506A Power Device Analyzer / Curve Tracer delivers comprehensive characterization of power semiconductor devices through integrated curve tracing and precision measurement capabilities. This instrument evaluates transistors, diodes, and other power electronic components across a broad voltage and current spectrum, making it essential for R&D validation, quality assurance, and failure analysis. The B1506A combines automated test sequences with user-programmable conditions to streamline device characterization workflows.
Technical Specifications
• Device Support: MOSFETs, IGBTs, BJTs, diodes, Thyristors
• Voltage Range: Broad spectrum across high-power applications
• Current Range: Low-power to high-current device accommodation
• On-Resistance (Rds(on)) Measurement: Precision on-state resistance characterization
• Breakdown Voltage Measurement: Accurate threshold determination for safety and operational limits
• Gate Threshold Voltage (Vgs(th)) Measurement: Switching characteristic evaluation
• Leakage Current Measurement: Off-state current assessment for efficiency evaluation
• High-Speed Data Acquisition: Transient behavior capture with high temporal resolution
• Programmable Power Sources: Integrated biasing for device test conditions
– Key Features
• Automated test routine definition and execution
• User-configurable voltage, current, temperature, and frequency parameters
• Data logging and preliminary analysis functionality
• Multiple test fixtures and adapters for various device packages
• Standard connectivity interfaces (GPIB, USB, LAN)
• Remote control interface for ATE system integration
– Typical Applications
• Power device design validation and optimization
• Quality assurance and production testing
• Failure analysis and characterization
• Efficiency and performance benchmarking of power semiconductors
– Compatibility & Integration
The B1506A integrates with Keysight’s power device analysis software suite and supports remote operation through standard industry interfaces for seamless incorporation into automated test environments.
