The Keysight B2902B is a dual-channel Precision Source Measure Unit (SMU) that integrates voltage and current sourcing with high-resolution measurement in a single benchtop instrument. It delivers 4-quadrant sourcing across ±210 V and up to 3 A DC (10.5 A pulsed), with measurement resolution down to 100 nV and 100 fA—enabling precise characterization of devices, materials, and low-current phenomena without reconfiguration. The B2902B sources at 1 µV / 1 pA resolution and samples at 50,000 Sa/s with a 10 µsec minimum digitizing interval, supporting both 4-wire measurements and high-capacitance load modes.
Technical Specifications
• Channels: 2 independent channels
• Source Output: ±210 V, 3 A DC / 10.5 A pulsed, 31.8 W per channel
• Source Resolution: 1 µV / 1 pA minimum
• Measurement Resolution: 100 nV / 100 fA minimum
• Resistance Measurement: 2 Ω to 200 MΩ
• Sampling Rate: 50,000 Sa/s
• Timing: 10 µsec minimum digitizing interval, 20 µs minimum timing interval
• Arbitrary Waveform Generator: Up to 100,000 levels with linear, logarithmic, and list sweep modes
• Display: 4.3-inch LCD color display with graphical and numerical modes
• Interfaces: GPIB, LAN, dual USB 2.0 (host/device), digital I/O
• Power Supply: 90–264 VAC, 47–63 Hz
• Dimensions: 260 mm W × 180 mm H × 480 mm D; 6 kg
– Key Features
• 4-quadrant source capability for bidirectional I-V characterization
• Dual-channel operation enables comparative or independent device testing
• Arbitrary waveform generation with up to 100,000 programmable levels
• 4-wire measurement support for eliminating lead-induced error in low-voltage applications
• High-capacitance measurement mode prevents oscillation with reactive loads
• SCPI programmable control with included application software
• Web-based graphical interface accessible over LAN
• Compatible with BenchVue, Quick I/V, and EasyEXPERT group+ software
– Typical Applications
• Component characterization and device parameter extraction
• Leakage current and ultra-low current measurement
• Semiconductor and material research and development
• Production test and device screening
• Pulse testing and transient characterization
– Compatibility & Integration
Standalone operation or integration into automated test systems via GPIB, LAN, or USB. SCPI command set enables custom measurement automation and data logging.
