The Keysight U4154A is an AXIe-based logic analyzer module that captures and analyzes high-speed digital signals up to 4 Gb/s. Engineered for complex digital design verification, it delivers real-time signal acquisition with configurable memory depths and advanced triggering capabilities. The module integrates directly into AXIe chassis ecosystems, enabling engineers to debug intricate digital interfaces and protocols with high fidelity while maintaining minimal loading on the device under test.
Technical Specifications
• Maximum Sample Rate: 4 Gb/s
• Memory Depth: 128 Mpts/channel, 256 Mpts/channel, 512 Mpts/channel, or 1 Gpts/channel (configurable)
• Data Rate: Up to 4 Gb/s per channel
• Input Impedance: High impedance design to minimize DUT loading
• Input Capacitance: Low capacitance to preserve signal integrity at high frequencies
• Triggering: State, timing, and sequence-based trigger modes with support for complex multi-signal conditions
• Channel Count: Configurable by model variant
– Key Features
• Deep memory acquisition supports extended trace durations for comprehensive signal analysis
• Advanced trigger architecture accommodates complex event detection across multiple signals
• High-impedance, low-capacitance input design reduces parasitic loading effects
• Real-time digital signal capture with jitter tolerance for high-speed operation
• AXIe form factor enables scalable integration with compatible chassis and additional modules
– Typical Applications
• High-speed digital interface validation and protocol debugging
• Complex timing and state-based signal analysis in multi-gigabit systems
• Deep trace acquisition for extended capture windows in signal-critical designs
• Real-time verification of digital logic behavior under demanding operational conditions
– Compatibility & Integration
The U4154A operates as an AXIe 1.0 compliant module and connects to compatible Keysight AXIe chassis systems. Standard AXIe connectivity enables straightforward integration with other modular instruments. Logic analyzer probes designed for Keysight systems interface with the module’s probe connectors for direct connection to devices under test.
