The Keysight B2901A is a single-channel precision Source/Measure Unit that integrates 4-quadrant sourcing and measurement capability into one benchtop instrument. It delivers wide dynamic range I-V characterization across devices and materials with 100 fA current measurement resolution and 1 µV sourcing resolution. The 4.3-inch color display supports graphical and numerical viewing modes, while SCPI command support and included PC software enable rapid integration into automated test environments.
Technical Specifications
Voltage Performance:
• Maximum output: 210 V
• Minimum source resolution: 1 µV
• Minimum measurement resolution: 100 nV
Current Performance:
• Maximum DC output: 3 A
• Maximum pulsed output: 10.5 A
• Minimum source resolution: 1 pA
• Minimum measurement resolution: 100 fA
Waveform & Digitizing:
• Arbitrary waveform generation supported
• Digitizing from 20 µs interval (50,000 pts/s maximum)
• Minimum programmable pulse width: 50 µs with 1 µs resolution
• Minimum list sweep/AWG interval: 20 µs
Measurement Techniques:
• 4-wire (Kelvin) measurement for accurate low-resistance and high-current tests
• High capacitance measurement mode for large capacitive loads
• Guarding function for sub-nanoampere measurements
– Key Features
• Single-channel benchtop configuration
• 4.3-inch color LCD with intuitive GUI for I-V curve viewing
• 4-quadrant source and measurement in one unit
• High throughput testing
• SCPI command set compliance
• Free application software: B2900A Quick I/V Measurement Software, EasyEXPERT group+, and BenchVue support
– Interfaces & Integration
• Ethernet/LAN (10/100Base-T, LXI core conformant)
• USB 2.0 with USB-TMC488 protocol
• GPIB (IEEE-488.2 compliant)
• Digital I/O available
– Typical Applications
Precision device characterization, semiconductor testing, solar cell analysis, power device evaluation, and materials research requiring sub-picoampere measurement capability.
