The Rohde & Schwarz NGSM32 is a programmable DC power supply engineered for automotive electronics, mobile radio, and car hi-fi testing. Dual-channel output with three selectable voltage ranges delivers precise voltage and current control, enabling simulation of transient operating conditions such as motor startup sequences. The unit excels at reproducing real-world supply variations and supports arbitrary waveform generation with stored device profiles for rapid test reconfiguration.
Technical Specifications
Output Ranges
• Voltage: 0–18 V, 0–32 V, or 0–60 V (selectable)
• Continuous current: 10 A (18 V and 32 V ranges), 5 A (60 V range)
• Pulse current: up to 30 A for 1 ms (surge applications)
• Short-term load current: up to 20 A (NGSM32/10)
Regulation Performance
• Voltage setting resolution: 10 mV or 20 mV (range-dependent)
• Deviation from full scale: <0.4% (0–18 V), <0.2% (0–32 V and 0–60 V)
• Stability with ±10% AC supply variation: <0.01% or <0.02%/°C
• Temperature stability (0°C to 45°C at 10–90% nominal current): <0.01% or <0.02%/°C
Arbitrary Waveform Generator
• Up to 60 reference values per voltage range with automatic interpolation
• Dwell time programmable from 1 ms to 4 s per step
• Storage: six complete device setups per voltage range or 12 setups for short tests
Measurement Capabilities
• High-resolution current measurement with trend indication
• Peak current measurement for power loading prediction
– Key Features
• Motor startup curve simulation (DIN 40839) for automotive transient testing
• RF-shielded design with insensitivity to external RF coupling
• High-precision standby current measurement for mobile radio applications
• Multiple stored profiles enable quick setup recall without reconfiguration
– Typical Applications
• Automotive electronics: central locking, ABS systems, car radio voltage-drop testing
• Mobile radio: standby current characterization with RF immunity
• Car hi-fi amplifier supply (high pulse current capability)
– Compatibility & Integration
Designed for production-line integration with DUT protection mechanisms and programmable setup storage for high-volume test automation.
