The Tektronix 577 Curve Tracer is a semiconductor characterization instrument that displays device behavior on a 6½-inch CRT screen. Introduced in November 1972, it enables precise evaluation of discrete transistors, linear integrated circuits, and other components through measured characteristic curves. Available in storage (577/D1) and non-storage (577/D2) configurations, the 577 supports plug-in test fixtures and adapters for flexible device connection and measurement across voltage and current ranges spanning six orders of magnitude.
Technical Specifications
Display & Storage
• 6½-inch CRT display
• 577/D1 model: Split-screen storage with variable stored brightness and beam finder
• 577/D2 model: Beam finder
Collector Supply
• Variable output: 0 to 1600 V
• Five selectable ranges: 6.5 V/10 A, 25 V/2.5 A, 100 V/0.6 A, 400 V/0.15 A, 1600 V/0.04 A
• Pulsed current capability: Up to 20 A (6.5 V range) and 80 mA (1600 V range)
• Peak power limits: 100 W, 30 W, 9 W, 2.3 W, 0.6 W, 0.15 W
• Series resistance: 0.12 Ω to 8 MΩ (14 steps)
Step Generator
• Current mode: 5 nA/step to 200 mA/step (with x0.1 multiplier available)
• Voltage mode: 5 mV/step to 2 V/step (with x0.1 multiplier available)
• Step rates: x1, x2, x4 line frequency
• Steps: 1 to 10 full-amplitude, repetitive or single family
Bias Supply
• Range: −12 V to +12 V, continuously variable
• Output impedance: <10 kΩ
Vertical (Current) Axis
• Deflection factor: 2 nA/div to 2 A/div (28 steps)
• With x10 magnification: 0.2 nA/div to 0.2 A/div
Horizontal (Voltage) Axis
• Collector voltage: 50 mV/div to 200 V/div (5 mV/div to 20 V/div with x10 magnification)
• Base voltage: −50 mV/div to 2 V/div (5 mV/div to 0.2 V/div with x10 magnification)
– Key Features
• Modular test fixture architecture supports discrete devices and integrated circuits
• Adjustable peak power limiting protects components during characterization
• Wide dynamic range for current measurement from nanoamperes to amperes
• Fine-resolution voltage stepping enables detailed curve families
– Typical Applications
• Transistor parameter verification and selection
• Linear IC characterization (op-amps, voltage regulators)
• Device reliability and failure analysis
• Procurement quality acceptance testing
– Compatibility & Integration
• 177 standard test fixture: Discrete transistor testing
• 178 test fixture: Linear integrated circuits
• Optional adapters available for additional component types and configurations
