The Tektronix DSA70804B is an 8 GHz Digital Serial Analyzer purpose-built for high-speed signal integrity analysis and serial data compliance testing. This four-channel instrument captures and characterizes fast transient signals with exceptional fidelity, isolate pattern-dependent effects and troubleshoot complex serial designs. Real-time sampling to 50 GS/s combined with deep memory and advanced triggering delivers the signal visibility required for demanding debug and validation workflows.
Technical Specifications
• Bandwidth: 8 GHz
• Channels: 4 analog
• Sample Rate: Up to 50 GS/s real-time; 25 GS/s simultaneous on all four channels
• Record Length: Up to 20 Megasamples standard; optional up to 100 Megasamples; up to 500 Megasamples with MultiView Zoom™
• Waveform Capture Rate: Over 300,000 waveforms/s per channel maximum – Key Features • Pinpoint® Triggering: Over 1400 trigger combinations for rapid event isolation and shortened debug cycles
• Serial Pattern Triggering: NRZ triggering to 6.25 Gb/s; pattern-based triggering to 3.125 Gb/s with 8b/10b protocol support
• Pattern Lock Triggering: Synchronizes acquisitions on long serial test patterns with high time base accuracy to remove random jitter
• Visual Trigger: Qualifies complex waveform events with graphical trigger definition
• Jitter, Noise, and Eye Diagram Analysis (Optional DJA): Identifies signal integrity concerns and jitter sources
• RT-Eye® Serial Compliance and Analysis: Domain-specific tools for high-speed serial measurement and standards compliance
• Serial Data Link Analysis (SDLA): Channel emulation, equalization, and fixture de-embedding for serial data streams
• Integrated View (iView™): Time-correlated display of digital and analog data in unified window
• Automatic Measurements: 53 measurements across Amplitude and related categories
• Superior signal-to-noise ratio and lowest jitter noise floor for accurate waveform representation – Typical Applications • High-speed serial protocol compliance testing and validation
• Signal integrity analysis on complex serial data designs
• Jitter characterization and decomposition
• Pattern-dependent fault isolation and debugging
• Eye diagram acquisition and analysis – Compatibility & Integration Serial Data Link Analysis, RT-Eye® analysis tools, and Protocol Triggering enable direct analysis of standards-based serial implementations. MultiView Zoom™ supports efficient navigation of extended capture records.
