The Keysight B1500A is a modular semiconductor device parameter analyzer mainframe designed for IV, CV, and pulsed dynamic measurements across research, development, and production environments. The system accommodates up to ten interchangeable measurement modules, enabling configuration for current applications with upgrade flexibility. Its 15-inch touchscreen and EasyEXPERT group+ software deliver an intuitive interface for measurement setup, execution, analysis, and data management on the mainframe or external PC.
Technical Specifications
Current-Voltage (IV) Measurement
• Measurement range: 0.1 fA to 1 A and 0.5 µV to 200 V
• Spot, sweep, sampling, and pulse measurement modes
• Ultra-fast IV sampling at 5 ns intervals (200 MSa/s)
• Pulsed IV capability with pulse widths down to 100 ns via WGFMU module
• Basic SMU modules (MPSMU, HPSMU, HRSMU) support pulsing and time-domain measurement with 500 µs intrinsic timing resolution
Capacitance-Voltage (CV) Measurement
• AC capacitance measurement: 1 kHz to 5 MHz
• Quasi-static CV (QS-CV) and C-t measurement modes
Pulsed and Dynamic IV
• High voltage pulse forcing: ±40 V for non-volatile memory evaluation
• WGFMU arbitrary waveform generation: pulse widths to 100 ns, 5 ns sampling rate
• Fast IV mode eliminates 50 Ω series resistance for ultra-fast measurements
• Supports NBTI and RTS noise (RTN) characterization
– Key Features
• Ten available slots for modular measurement unit configuration
• Windows 10 (WES10) or Windows 7 embedded platform
• High-resolution measurement down to 0.1 fA and 0.5 µV
• Simultaneous voltage and current measurement capability
– Typical Applications
• Non-volatile memory device characterization
• High-speed device evaluation
• Noise analysis and parametric stability testing
• Semiconductor material and process development
– Compatibility & Integration
Operation on mainframe 15-inch touchscreen or external PC via EasyEXPERT group+ software.
