The Agilent/Keysight 4140A is a precision picoampere meter and DC voltage source instrument designed for DC characteristic measurements of semiconductor devices and materials. It integrates a stable pA-level measurement capability with two programmable DC voltage sources, one featuring ramp and staircase generation. The instrument supports leakage current analysis, I-V characterization, and quasi-static C-V measurements essential for device physics research and semiconductor quality control.
Technical Specifications
• Current Measurement: Picoampere range with resolution to 0.001 × 10⁻¹² A
• Voltage Sources: Two programmable DC sources; -100 V to +100 V with 10 mV resolution
• Voltage Source Functions: DC output, ramp generation, staircase generation
– Key Features
• Highly stable picoampere meter paired with dual programmable voltage sources
• Ramp and staircase waveform generation on one voltage source for dynamic characterization
• High-resolution current sensing for leakage and insulation resistance measurements
• Programmable control architecture for automated test sequences
– Typical Applications
• Leakage current measurement in semiconductor devices and materials
• Current-voltage (I-V) characteristic analysis
• Quasi-static capacitance-voltage (C-V) measurements at semiconductor interfaces
• Insulation resistance testing of electronic components
• Device physics research and failure analysis
– Compatibility & Integration
• HP-IB (IEEE-488) interface for remote control and automated data acquisition
• Integration into programmed test systems for production and laboratory environments
