The Agilent/Keysight 4140B is a semiconductor parameter analyzer for DC characterization of devices and materials. It delivers picoampere-level current measurement, synchronized I-V analysis, and quasi-static C-V capability. Two programmable DC voltage sources enable flexible DC, ramp, and staircase stimulus patterns with independent current limiting. HP-IB interface supports remote operation and high-speed data streaming for integration into automated test systems.
Technical Specifications
Current Measurement
• 11 ranges from ±0.001 pA to 10 mA full scale with 10 fA resolution
• 99.9% overrange on all ranges
Voltage Sources
• Two programmable DC sources: −100 V to +100 V, 10 mV resolution
• One source generates DC, ramp (1 mV/s to 1 V/s), or staircase patterns
• Second source provides stable DC bias
• Programmable current limits: 10⁻⁴ A, 10⁻³ A, 10⁻² A
Capacitance Measurement
• Quasi-static C-V from voltage ramp: 0.1 pF to 1999 pF
• Two measurement ranges: 0.0−100.0 pF and 200−1000 pF full scale with 99.9% overrange
• %C display (0.0% to 199.9% of oxide capacitance)
Measurement Performance
• Measurement interval: 4 ms to 2.56 s
• Selectable integration times (short, medium, long) for speed/accuracy trade-off
• Zero offset cancellation: 100 fA (leads/fixtures), 100 pF (C-V mode)
• Line filter for picoampere measurements in noisy environments
– Key Features
• Synchronized I-V and quasi-static C-V characterization
• Flexible sweep control with AUTO/START, MAN (PAUSE), STEP, ABORT modes
• Analog outputs for X-Y recorder plotting (I-V, C-V, pen control, limit voltages)
• External, internal, and HOLD/MAN trigger options
• Automatic self-test of digital and analog circuits
• High-speed HP-IB data output at 4 ms intervals
– Typical Applications
• Semiconductor device characterization and model parameter extraction
• MOS transistor and diode DC analysis
• Leakage current and capacitance measurement
• Quality control and reliability screening in manufacturing
– Compatibility & Integration
HP-IB (IEEE 488) interface supports SH1, AH1, T5, L4, SR1, RL1, DC1, DT1 capabilities for system integration, remote programming, and automated data acquisition.
