The Agilent/Keysight 4268A is a benchtop capacitance meter delivering high-speed, precision measurements of capacitance, dissipation factor, quality factor, and equivalent resistance parameters. Engineered for production and laboratory environments, it supports dual test frequencies (120 Hz and 1 kHz) with selectable signal levels from 0.1 V to 1.0 V ±10% accuracy. The instrument excels at characterizing multi-layer ceramic capacitors (MLCCs) under constant test signal conditions, complying with IEC 384-10 standards. High-speed measurements complete in 25 ms, enabling rapid throughput in quality control workflows.
Technical Specifications
Measurement Parameters:
• Capacitance (Cs, Cp)
• Dissipation Factor (D)
• Quality Factor (Q)
• Equivalent Series Resistance (Rs)
• Equivalent Parallel Resistance (Rp)
• Equivalent Parallel Conductance (G)
Frequencies & Signal Levels:
• 120 Hz ±1% and 1 kHz ±0.05%
• Selectable signal levels: 0.1 V to 1.0 V in 0.01 V increments
• Output modes: Continuous and Synchronous
• Source delay: 0 to 1.000 s (1 ms resolution)
Measurement Ranges:
• 120 Hz: 1 nF to 1 mF (seven ranges)
• 1 kHz: 1 nF to 100 µF (six ranges)
• MLCC capability: 70 µF at 1 Vrms (1 kHz); 600 µF at 1 Vrms (120 Hz)
Measurement Speed:
• High-speed mode: 25 ms per measurement
• Selectable timing: Short, Medium, Long
• Averaging: 1 to 256 repetitions
Display Ranges:
• Cs/Cp: 0.0001 nF to 9.9999 mF
• D: 0.0001 to 9.9999
• Q: 0.1 to 9999.9
• Rs/Rp: 0.01 mΩ to 999.99 MΩ
• G: 0.0001 µS to 9.9999 kS
– Key Features
• Nine-bin comparator function for component sorting and classification
• Contact check ensures reliable measurement integrity
• Auto Level Control (ALC) with selectable measurement ranges (Auto/Hold)
• Trigger modes: Internal, Manual, External, Bus
• Trigger delay: 0 to 1.000 s (1 ms resolution)
• Measurement cable lengths: 0 m, 1 m, 2 m (dc cable resistance ≤0.3 Ω per conductor)
– Typical Applications
• MLCC characterization and acceptance testing
• Production line quality control
• Component evaluation and sorting
• Circuit design validation
– Compatibility & Integration
• GPIB interface for test automation
• Handler interface support for production integration
