The Agilent/Keysight 4396A is a three-function RF test instrument combining vector network analyzer, spectrum analyzer, and optional impedance analyzer capabilities in a single platform. It delivers comprehensive RF component and system characterization across 100 kHz to 1.8 GHz for network analysis and 2 Hz to 1.8 GHz for spectrum analysis, with simultaneous dual-channel display for split-screen viewing of transmission, reflection, and spectral data.
Technical Specifications
Network Analyzer Mode
• Frequency range: 100 kHz to 1.8 GHz
• Frequency resolution: 1 mHz
• Dynamic magnitude accuracy: ±0.05 dB
• Dynamic phase accuracy: ±0.3 degrees
• Source output power: -60 dBm to +20 dBm
• Source power resolution: 0.1 dB
• Measurements: Gain, phase, group delay, distortion, spurious, carrier-to-noise, noise, and reflection parameters (return loss, SWR, S-parameters with external test set)
Spectrum Analyzer Mode
• Frequency range: 2 Hz to 1.8 GHz
• Resolution bandwidth: 1 Hz to 3 MHz (1-3-10 sequence)
• Overall level accuracy: ±1.0 dB
• Sensitivity (DANL): -150 dBm/Hz at 10 MHz; -147 dBm/Hz at 1 GHz
• Noise sidebands: Below -105 dBc/Hz at 10 kHz offset (carriers below 1 GHz)
• Measurements: Gain, phase, group delay, distortion, spurious, carrier-to-noise, noise
– Key Features
• Color CRT display with dual independent channels for simultaneous waveform viewing
• Synthesized source with 0.1 dB power resolution and -60 to +20 dBm output range
• HP-IB (IEEE 488) interface for remote control and automation
• HP Instrument BASIC automation option (e.g., 1C2 configuration)
• Built-in disk drive and RAM storage for measurement data
• Digital I/O port for external system integration
• Optional impedance measurement function with 43961A test kit compatibility
– Typical Applications
RF component characterization, filter and amplifier testing, transmission line analysis, noise figure measurements, distortion quantification, and S-parameter extraction in laboratory and production environments.
– Compatibility & Integration
Designed for use with external test sets enabling reflection measurements. Supports HP Instrument BASIC for test automation and integrates with HP-IB networks for production-line integration and remote monitoring.
