The Keysight B1505A is a Power Device Analyzer/Curve Tracer that characterizes power semiconductor devices across a single, modular platform. It combines curve tracing with dedicated device analysis, delivering measurements from sub-picoampere leakage currents to 1500 A at voltages up to 10 kV. The instrument’s 10-slot mainframe accepts multiple plug-in modules—including High Voltage SMU, High Current SMU, Ultra-High Current, Ultra-High Voltage, High Voltage Medium Current, and High-Power SMU variants—enabling flexible configuration for diverse measurement demands.
Technical Specifications
• Voltage Range: Up to 10 kV
• Current Range: Up to 1500 A
• Current Measurement Resolution: Sub-picoampere level
• On-Resistance Measurement Resolution: Microohm level
• Pulse Width: 10 µs minimum
• Sampling Rate: 2 µs per channel (dual independent ADCs)
• Capacitance Measurement: 1 kHz to 5 MHz (Multi-Frequency CMCMU)
• Gate Charge Evaluation: Up to 3 kV bias
• High Voltage Capacitance Bias: Up to 3 kV
• On-Wafer Test Capability: Supports > 200 A and 10 kV operation
– Key Features
• Pulsed and dynamic IV measurement with oscilloscope waveform visualization
• Automated capacitance evaluation (Ciss, Coss, Crss)
• IGBT and MOSFET characterization including gate charge and on-resistance
• Wide-bandgap device support for SiC and GaN evaluation
• 15-inch touchscreen interface with Windows operating system
• Keysight EasyEXPERT group+ software with hundreds of pre-built application tests
– Typical Applications
• Power device research and development
• On-wafer characterization of unpackaged devices
• Quality control and device validation
• High-power switching converter efficiency analysis
• Wide-bandgap semiconductor evaluation
– Compatibility & Integration
The B1505A integrates with automated wafer probers for repeatable, high-throughput testing sequences. Software automation supports both interactive operation and scripted characterization workflows.
