The Keysight B2912B is a dual-channel precision Source/Measure Unit (SMU) delivering 4-quadrant sourcing and simultaneous measurement capabilities for advanced I-V characterization. Each channel functions as both current and voltage source and meter, with output to ±210 V and ±3 A DC (±10.5 A pulsed). Resolution reaches 10 fA and 100 nV across source and measurement paths. The instrument captures transient phenomena at up to 100,000 Sa/s with 10 µs minimum timing intervals, delivering maximum 31.8 W output power. A 4.3-inch color LCD provides graphical and numerical display modes. Connectivity spans GPIB, LAN/Ethernet, USB 2.0, and digital I/O, with support for 2-wire and 4-wire measurement topologies via banana jack inputs. The B2912B integrates with BenchVue, web-based graphical control, Quick I-V Measurement Software, and EasyEXPERT group+ for automated parametric characterization. SCPI command support enables remote operation from PC without custom programming across all interfaces.
Technical Specifications
• Channels: 2
• Voltage Output Range: ±210 V
• DC Current: ±3 A
• Pulsed Current: ±10.5 A
• Source Resolution: 10 fA / 100 nV minimum
• Measurement Resolution: 10 fA / 100 nV minimum
• Sampling Rate: 100,000 Sa/s (10 µs minimum interval)
• Maximum Output Power: 31.8 W
• Display: 4.3-inch color LCD (graphical and numerical modes)
– Key Features
• Integrated 4-quadrant sourcing and measurement on both channels
• Digitizing capability for low-frequency transient capture and display
• Multiple interface support: GPIB, LAN/Ethernet, USB 2.0, digital I/O (D-sub 25-pin)
• 2-wire and 4-wire measurement configuration options
• Banana jack connectivity for flexible test fixture integration
– Typical Applications
• Optical device characterization (laser diodes, photodiodes, VCSELs for 3D sensing)
• Organic light-emitting devices (OLEDs)
• Photovoltaic and solar cell testing
• Nano-technology material characterization
• Power management device evaluation (LDOs)
• Semiconductor device testing (FETs, transistors)
• Passive component measurements (resistors, diodes, varistors)
• LED I-V characterization
• Resistance and ADC converter testing
– Compatibility & Integration
PC-based control via BenchVue, web-browser graphical interface, Quick I-V Measurement Software, and EasyEXPERT group+ parametric solution. SCPI command support enables remote measurement execution and instrument automation across GPIB, Ethernet, and USB interfaces.
