The Ametek/EG&G/Princeton Applied Research 5210 is a dual phase lock-in amplifier designed for precision measurement and recovery of low-level signals in high-noise environments. It simultaneously measures in-phase (X) and quadrature (Y) signal components across a 0.5 Hz to 120 kHz bandwidth, providing both Cartesian (X-Y) and polar (R-θ) output formats. The instrument achieves 130 dB dynamic reserve through Walsh Function Demodulators, ensuring excellent linearity and stability across demanding applications.
Technical Specifications
• Frequency Range: 0.5 Hz to 120 kHz
• Voltage Sensitivity (Full Scale): 100 nV to 3 V rms
• Current Sensitivity (Full Scale): 10 fA to 30 nA or 10 fA to 3 µA
• Input Impedance: 100 MΩ (voltage); 25 Ω typical (current)
• Internal Oscillator: 0.5 Hz to 120 kHz, 1 mV to 2 V rms amplitude
• Dynamic Reserve: 130 dB
• Output Display: 3½ digit readout
• Line Rejection Filters: Selectable for 50/60 Hz and/or 100/120 Hz
– Key Features
• Dual phase demodulator with simultaneous X and Y measurement
• Walsh Function Demodulators for high linearity and stability
• Calibrated sensitivity with continuous vernier adjustment
• Auto vernier control for relative measurements
• Current preamplifier with dual transimpedance settings for direct photodiode coupling
• Differential input support (A only or A-B configurations)
• Overload and reference unlock indicators
• Manual (Local) or computer (Remote) control capability
• Front panel indicators disableable for blackout operation
• Analog demodulator outputs suitable for feedback control and envelope recovery applications
– Typical Applications
• Lock-in detection of weak signals in electronic noise
• Phase-sensitive measurement in optical and photonic systems
• Feedback control systems requiring true analog demodulation
• Carrier envelope modulation recovery
• Low-level current measurements from photodiodes
• AC bridge measurements and impedance analysis
– Compatibility & Integration
The 5210 accepts both voltage and current inputs through selectable front panel configurations. The instrument supports remote control for integration into automated measurement systems.
