The Anritsu MS9740A Optical Spectrum Analyzer delivers precise spectral analysis across the visible to near-infrared band, addressing requirements in R&D and manufacturing environments. This instrument evaluates optical devices—SFP, XFP, and SFP+ modules, transceivers, VCSEL and DFB lasers—displaying center wavelength, level, spectrum, SMSR, and OSNR on a single screen. Fast measurement cycles under 0.2 seconds enable rapid device characterization. When paired with a Bit Error Rate Tester, it supports comprehensive analysis of transceiver outputs and WDM signals.
Technical Specifications
• Wavelength Range: 600 nm to 1750 nm
• Dynamic Range: 58 dB at 0.4 nm from peak (standard); 60 dB at 0.4 nm (high mode); 70 dB at 1 nm from peak
• Wavelength Accuracy: ±20 pm (1520–1620 nm, 0.03–0.2 nm resolution); ±50 pm (1530–1570 nm, 0.07–0.2 nm resolution); ±100 pm (1520–1620 nm, 0.5–1.0 nm resolution); ±300 pm (600–1520 nm)
• Wavelength Linearity: ±20 pm (1520–1620 nm)
• Resolution Bandwidth: 0.03, 0.05, 0.07, 0.1, 0.2, 0.5, 1.0 nm; minimum 30 pm
• Level Accuracy: ±0.4 dB (1310/1550 nm, –10 dBm input, >0.1 nm resolution)
• Level Linearity: ±0.05 dB (1550 nm, –30 to +20 dBm, optical ATT off)
• Polarization Dependency: ±0.05 dB (1550/1600 nm)
• Measurement Speed: <0.2 seconds (5 nm span)
• Input Power Range: –90 to +10 dBm (1250–1600 nm); –85 to +10 dBm (1000–1250 nm, 1600–1650 nm); –65 to +10 dBm (600–1000 nm, 1650–1700 nm); –55 to +10 dBm (1700–1750 nm)
– Key Features
• Single-screen display of optical metrics
• Dual dynamic range modes for flexibility in noise floor and signal separation
• Fine resolution down to 30 pm for narrow-linewidth source characterization
• High optical sensitivity to –90 dBm in critical C-band window
– Typical Applications
• Optical transceiver and module validation
• Laser spectral purity and linewidth measurement
• WDM signal analysis and channel isolation verification
• OSNR and SMSR evaluation in optical systems
– Compatibility & Integration
Integrates with Bit Error Rate Testers for joint spectral and signal-quality assessment of optical transceivers.
