The HP/Agilent 4156A Precision Semiconductor Parameter Analyzer delivers DC characterization of semiconductor devices with four high-resolution source measure units and dual voltage sourcing capability. This benchtop instrument performs I-V curve analysis, device parameter extraction, and reliability stress testing across diodes, transistors, ICs, solar cells, and wafers. It integrates into standalone or automated test environments for R&D, failure analysis, and incoming inspection workflows.
## Technical Specifications
**Source Measure Units (SMUs)**
• Four high-resolution SMUs per instrument
• Current range: 1 fA to 100 mA
• Current resolution: 1 fA
• Current accuracy: 20 fA
• Voltage range: 2 V to 100 V
• Voltage resolution: 2 µV
• Voltage accuracy: 200 µV
• Full Kelvin remote sensing on each SMU for low-resistance device characterization down to approximately 50 Ω
**Voltage Source Units (VSUs)**
• Two VSUs included
• Voltage range: 20 V
• Current capability: 100 mA
**Voltage Monitor Units (VMUs)**
• Two VMUs included
• Input impedance: 1 GΩ
• Differential mode offset function: 1 µV
• Resolution: 0.2 µV (differential measurement mode)
## Key Features
• Constant voltage and current sourcing modes
• Linear and logarithmic sweep modes with variable step sizing
• Staircase and pulse sweep measurement
• Pulsed measurement mode for transient characterization
• Sampling (time domain) measurement capability
• Color CRT display with four graphic memories for data comparison
• Automatic parameter extraction and graphical analysis functions
## Typical Applications
• I-V curve measurement and device characterization
• MOSFET Id-Vg graphing and analysis
• Logical gate switching characteristics
• Hot carrier injection and flash EEPROM reliability testing
• Go/no-go device evaluation
• Low-level leakage current measurement on low-resistance devices
## Compatibility & Integration
Operates as standalone benchtop instrument or within integrated automated test systems for semiconductor manufacturing environments.
