The Keithley 2002 is an 8½-digit digital multimeter with integrated scanning capabilities, delivering laboratory-grade accuracy and resolution for production testing, design verification, and metrology. Built on a 28-bit ADC architecture, it achieves true 8½-digit resolution with 1 nV DCV sensitivity and 0.0006% basic accuracy across a single 1 µV to 20 V range. Beyond voltage and resistance, the instrument captures AC measurements from 1 Hz to 15 MHz, including peak, RMS, average, and crest factor; temperature via thermocouple and RTD sensors; and transient spikes as brief as 1 µs. An optional rear-panel multiplexer card transforms the 2002 into a multi-point scanning system, while simultaneous multi-parameter display on a single connection reduces instrument overhead.
## Technical Specifications
• **DC Voltage:** 1 nV sensitivity; 0.0006% basic accuracy; 1 µV to 20 V range
• **AC Voltage:** 750 V maximum; measurements from 1 Hz to 15 MHz; better than 0.1% accuracy at 1 Hz
• **Resistance:** 1000 Ω maximum; 4-wire single-phase method with open-lead detection
• **Current:** 2 A maximum (DC and AC)
• **Frequency:** 1 Hz to 15 MHz measurement range with adjustable trigger level
• **Temperature:** J, K, N, T, E, R, S, B thermocouple and RTD types supported
• **Spike Capture:** Peak detection down to 1 µs; 1 MHz repetitive or 1 µs single-event operation
• **ADC Resolution:** 28-bit converter; true 8½-digit display
## Key Features
• Advanced AC measurement modes: peak, RMS, average, AC, AC+DC coupling, and low-frequency RMS
• Crest factor measurement for signal characterization
• Simultaneous multi-parameter display from single connection
• Built-in current, temperature, peak spike, and AC crest factor functions
• Optional rear-panel multiplexer card slot for multi-point scanning
## Typical Applications
• Precision production testing with minimal range-shift error
• Design verification requiring transient capture and multi-frequency analysis
• Metrology and calibration work demanding sub-microvolt resolution
## Compatibility & Integration
Scanning option via card-slot multiplexer for expanded channel measurement.
