The Keithley 236 Precision Source-Measure Unit (SMU) integrates voltage sourcing, current sourcing, voltage measurement, and current measurement into a single instrument. It enables simultaneous sourcing and measurement of voltage or current, making it ideal for semiconductor device characterization, materials testing, and automated test equipment applications.
## Technical Specifications
**Source and Measure Range**
• Voltage sourcing: 100 µV to 110 V
• Current sourcing: 100 fA to 100 mA
• Voltage measurement: 10 µV to 110 V
• Current measurement: 10 fA to 100 mA
• Measurement sensitivity: 10 fA, 10 µV
**Performance and Timing**
• Measurement rate: Up to 1000 measurements per second
• Source-delay-measure cycle time: 1 ms minimum
• IEEE-488 command response: 25 ms
• Internal buffer measurement rate: 1 ms per point
• Continuous DC measurement speed: 110 readings per second
• Trigger latency: < 2 ms
**Integration Time Options (Measure)**
• Fast: 416 µs (4-digit resolution)
• Medium: 4 ms (5-digit resolution)
• Line cycle: 16.67 ms (60 Hz) or 20.00 ms (50 Hz) (5-digit resolution)
**Compliance Settings**
• Voltage compliance: Bipolar, maximum ±110 V; minimum ±0.1% of selected current range
• Current compliance: Bipolar, maximum ±100 mA; minimum ±0.1% of range or 0.5% of 1.1 V range
## Key Features
**Ranging and Selection**
• Source: Auto-ranging via keypad; fixed range via rotary dial; fully programmable in SWEEP function
• Measure: Auto or fixed range based on compliance value
**Filtering and Data Processing**
• Selectable filter: Averages n measurements (n = 2, 4, 8, 16, or 32)
• Suppress function: Subtracts reference measurement from subsequent readings
• Elapsed time measurement: Records time from sweep trigger to measurement completion per sweep step
**Sweep Capabilities**
• Linear, logarithmic, and pulse sweep modes for voltage and current
• START, STOP, STEP parameter method
• Waveform operations: CREATE, APPEND, MODIFY for custom sequences
• Parameter appending for complex test sequences
## Typical Applications
Semiconductor device characterization, materials testing, and component verification within automated test systems.
