The Keithley 4211-SMU is a high-power source-measure unit (SMU) designed for precision DC I-V characterization of devices and materials. Operating as a modular card within the Keithley 4200A-SCS Parameter Analyzer mainframe, it integrates voltage and current sourcing with measurement capabilities in a single instrument. The 4211-SMU delivers stable low-current measurements even in test setups with up to 100 µF of load capacitance—a critical advantage over competitive units that degrade with capacitances as low as 1,000 pF. This makes it ideal for LCD display manufacturing, nano FET testing, and other high-capacitance applications.
Technical Specifications
• Voltage Range: ±210 V (source and measure)
• Current Range: ±1.05 A, ±1 A (source and measure)
• Voltage Measurement Resolution: 0.2 µV
• Current Measurement Resolution: 10 aA (extends to sub-fA levels with optional 4200-PA Remote Preamplifier)
• Load Capacitance Tolerance: Up to 100 µF
• Operation Mode: 4-quadrant
• Very Low Frequency Measurements: 10 mHz to 10 Hz (capacitance characterization)
– Key Features
• Shielded triaxial connections with active guarding for low-current and high-impedance measurements
• 4-wire (Kelvin) force and sense connections for accurate voltage and current delivery
• 2-wire and 4-wire measurement configurations supported
• Modular card design integrating into the 4200A-SCS mainframe
• Optional 4200-PA Remote Preamplifier/Switch Module (RPM) for enhanced sensitivity
– Typical Applications
• LCD display panel characterization
• Nano FET device testing
• DC I-V material and device characterization
• High-capacitance load testing
• Low-current and high-impedance measurements
– Compatibility & Integration
The 4211-SMU functions exclusively as a module within the Keithley 4200A-SCS Parameter Analyzer. Clarius+ Software provides interactive control and test definition. The instrument is designed for measurement, control, and data I/O connections with low transient overvoltages and must not be directly connected to mains voltage.
