The Keysight B2902A is a 2-channel precision source/measure unit delivering integrated 4-quadrant sourcing and measurement for efficient I/V characterization without requiring multiple instruments. It combines femtoampere-level measurement resolution with programmable voltage and current sourcing across three dynamic ranges, making it suitable for device characterization from nanotech materials to power management circuits. The instrument features a 4.3-inch color display with graphical and numerical modes, arbitrary waveform generation, and flexible measurement configurations including 2-wire and 4-wire setups.
Technical Specifications
• Channels: 2
• Measurement Resolution: 100 fA current, 100 nV voltage
• Source Resolution: 1 pA current, 1 µV voltage
• DC Current Output: ±3.03 A maximum
• Pulsed Current Output: 10.5 A maximum
• Voltage Output: ±210 V maximum
• Sourcing Ranges: ±6 V @ ±3.03 A; ±21 V @ ±1.515 A; ±210 V @ ±105 mA
• Measurement Ranges: 210 V voltage, 3 A current
• Digitizing Interval: 20 µs
– Key Features
• 4-quadrant source/measure capability for single-pass I/V characterization
• User interface with graphical and numerical display modes
• Arbitrary waveform generation for complex sourcing profiles
• SCPI command support and conventional SMU command sets for automated testing
• Software control via BenchVue, B2900A graphical web interface, and Quick I/V measurement software
• Safety interlock for high-voltage protection (required for sourcing above ±42 V)
• 2-wire and 4-wire measurement configurations
• Single channel, dual channel, graph, and roll (I-t or V-t curve) measurement views
– Typical Applications
Semiconductor and discrete device characterization; optical devices including laser and photodiodes; organic electronics (OLEDs); photovoltaic cells; passive components; MEMS and nanotechnology materials; power management devices; transistor and FET testing; production diode screening.
– Compatibility & Integration
PC-based control through free application software. Supports both graphical web interface and command-line instrument automation.
