The Teledyne LeCroy T3EL150302P is a single-channel programmable DC electronic load rated at 200 W with a maximum current of 30 A and voltage range of 0 V to 150 V. It delivers four operating modes—Constant Current (CC), Constant Voltage (CV), Constant Resistance (CR), and Constant Power (CP)—plus dynamic variants including CC dynamic up to 25 kHz, CP dynamic to 12.5 kHz, and CV dynamic to 0.5 Hz. The instrument measures voltage and current at up to 500 kHz with 1 mV/1 mA minimum resolution and features adjustable current rise time from 0.001 A/µs to 2.5 A/µs.
Technical Specifications
• Power Rating: 200 W
• Voltage Range: 0 V to 150 V DC
• Current Range: 0 A to 30 A
• Minimum Operating Voltage: 0.15 V at 5 A; 0.9 V at 30 A
• CV Mode Accuracy: ±(0.05% + 0.025% FS), 50 ppm/°C temperature coefficient
• CC Mode Accuracy: ±(0.1% + 0.1% FS), 100 ppm/°C temperature coefficient
• CR Mode Accuracy: 0.01% + 0.08 s (0.05–10 Ω) or 0.01% + 0.0008 s (10–10000 Ω)
• CP Mode Accuracy: 0.1% + 0.1% FS
• Measurement Speed: Up to 500 kHz for voltage and current
• Current Rise Time: 0.001 A/µs to 2.5 A/µs (adjustable)
• Display: 3.5-inch TFT-LCD
• Dimensions: 256 × 115 × 410 mm (W × H × D)
• Weight: 5.8 kg
• AC Input: Selectable 110 V or 220 V
– Key Features
• Four-wire SENSE compensation mode for lead resistance correction
• List function with up to 100 programmable steps
• Program function supporting 50 groups of steps
• Protection: OCP, OVP, OPP, OTP, and LRV
• Built-in application functions: Short Circuit Test, Battery Test Mode, CR-LED Mode, OCP and OPP Tests
• Waveform trend chart display
• External analog control via 0–10 V signals
• USB support for FAT32-formatted storage devices
– Typical Applications
Electronic component testing, battery characterization, portable charger validation, power adapter evaluation, and general power supply stress testing.
– Compatibility & Integration
Remote control via RS232, USB, and LAN (RJ45) connectivity. SCPI command support and LabVIEW driver compatibility enable integration into automated test environments.
