The Teledyne LeCroy T3PS23203P is a dual-channel, programmable linear DC power supply engineered for precision testing in laboratory and development environments. Each independent output delivers 0–32 VDC at 0–3 ADC, with 192 W total maximum power and exceptional voltage ripple performance of ≤350 µVrms. The unit operates in Constant Voltage and Constant Current modes, supports series and parallel tracking without external wiring, and features electronic load functionality in CV, CC, and CR modes for battery charge/discharge testing.
Technical Specifications
• Output Configuration: 2 independent channels
• Voltage Range: 0–32 VDC per channel
• Current Range: 0–3 ADC per channel
• Total Power Output: 192 W maximum
• Programmable Resolution: 1 mV voltage, 0.1 mA current
• Readback Resolution: 0.1 mV voltage, 0.1 mA current
• Voltage Ripple & Noise: ≤350 µVrms
• Current Ripple: ≤2 mArms
• Transient Response Time: ≤50 µs
• Line Regulation: ≤0.01% + 3 mV (voltage); ≤0.2% + 3 mA (current)
• Load Regulation: ≤0.01% + 3 mV (voltage, ≤3 A); ≤0.2% + 3 mA (current)
• Tracking Error: ≤0.1% + 10 mV of Master (0–32 V, no load; add ≤100 mV with load)
• Tracking Modes: Independent operation, series tracking, parallel tracking
• Protection: Hardware over-voltage and over-current protection
• Dimensions: 213 mm (W) × 145 mm (H) × 312 mm (D)
• Weight: 7.5 kg
• Mounting: Bench top
– Key Features
• Independent output on/off switching per channel
• Automatic series and parallel circuit configuration via internal switching
• Electronic load modes for CV, CC, and CR operation
• Hardware-based overvoltage and overcurrent protection
• Sub-microsecond transient response for sensitive device testing
– Typical Applications
• Multi-device and multi-circuit simultaneous testing
• Battery charge and discharge characterization
• Semiconductor and component validation
• Automated test system integration
– Compatibility & Integration
Remote control and automation support USB, RS-232, LAN, and External I/O interfaces for seamless integration into automated test environments.
