The Keysight U2941A Parametric Test Fixture enhances source measure unit (SMU) capabilities for precise semiconductor component testing. This specialized fixture supports SMD and DIP device configurations with interchangeable socket modules, ESD protection, and low-leakage measurement design. It integrates with the U2722A and U2723A SMUs to deliver stable, repeatable characterization in laboratory and production environments.
Technical Specifications
• Maximum voltage: 60 VDC
• Maximum current: 1 A
• Measurement channels: Up to three source/measure channels plus common ground
• Socket modules: Five interchangeable types for varied DUT pinouts
• Low-current measurement plate: PTFE assembly for minimal leakage
– Key Features
• ESD protection via closed lid design
• Five socket module types for component adaptability
• Parametric Measurement Manager software included
• IV curve plotting with auto-scaling, zoom, and marker functions
• Data export in .txt format; graph export in .JPEG format
• Graphical user interface for rapid instrument configuration and test execution
– Typical Applications
• SMT and DIP IC characterization
• Semiconductor device parametric testing
• Low-current component measurement
• IV curve acquisition and analysis
– Compatibility & Integration
The U2941A operates with the Keysight U2722A USB modular source measure unit. When paired with the U2722A, it supports the U2751A USB modular switch matrix for expanded test system capability. Connection cables and socket modules are included for direct integration with compatible SMUs.
