The HP Agilent 6674A is a single-output DC power supply delivering 0–60 V at 0–35 A with 2000 W total output capacity. Built for both benchtop and system-integrated operation, it provides stable, regulated DC power for demanding engineering, laboratory, and industrial test environments. The unit operates in constant voltage (CV) and constant current (CC) modes with tight load and line regulation: CV mode achieves ≤0.01% + 1 mV regulation, while CC mode delivers ≤0.02% + 5 mA. Output ripple and noise are minimized to ≤1 mV RMS and ≤5 mV peak-to-peak in CV mode. Transient response settles to within 0.1% of voltage in under 400 µs during 50–100% load step changes. The supply accepts 190–264 Vac input (switchable to 95–132 Vac) at 47–63 Hz with typical inrush current below 25 A peak. Overvoltage protection (OVP), overcurrent protection (OCP), and internal over-temperature protection safeguard connected equipment. Remote sensing terminals compensate for lead voltage drop, ensuring accurate voltage delivery at the load. Front-panel controls enable local operation, while SCPI-compatible GPIB programming supports remote control and system integration. Forced-air cooling maintains thermal stability under continuous operation.
Technical Specifications
• Output: 0–60 V, 0–35 A, 2000 W (single output)
• Load Regulation (CV): ≤0.01% + 1 mV; (CC): ≤0.02% + 5 mA
• Line Regulation (CV): ≤0.01% + 1 mV; (CC): ≤0.02% + 5 mA
• Ripple and Noise (CV): ≤1 mV RMS, ≤5 mV peak-to-peak
• RMS Current (CC): ≤10 mA
• Transient Response: <400 µs to 0.1% voltage change (50–100% load step)
• Input: 190–264 Vac (47–63 Hz), with rear-panel switch to 95–132 Vac
• Inrush Current: <25 A peak at 25 °C
– Key Features
• Dual-mode operation: constant voltage and constant current
• Multi-layer protection: OVP, OCP, and over-temperature shutdown
• Remote sensing for voltage-drop compensation across output leads
• SCPI-compatible programming via GPIB for automated test systems
• Forced-air cooling for sustained high-power operation
– Typical Applications
• Automated test equipment (ATE) systems
• Semiconductor and component testing
• Product characterization and aging studies
• Laboratory and R&D power requirements
– Compatibility & Integration
• Rear-panel AC input, DC output terminals, and remote sense connections
• GPIB (IEEE 488.2) interface for system integration
• Front-panel local control for standalone benchtop use
