The Keithley 4200A-CVIV is a modular switching module that integrates with the 4200A-SCS Parameter Analyzer to enable automated electrical characterization of semiconductor devices. The system performs current-voltage (I-V), capacitance-voltage (C-V), ultra-fast pulsed I-V, and complex AC resistance measurements across four multiplexed channels. By switching between measurement types without re-cabling or lifting prober needles, the 4200A-CVIV reduces test time and preserves measurement integrity during device characterization.
## Technical Specifications
• Four-channel multiplexed switching for I-V and C-V measurements
• DC bias range: ±210 V
• High-voltage C-V capability: ±200 V or 400 V differential (with bias tee modes)
• Current resolution: 0.1 pA
• Weight: 1.81 kg (4 lbs)
• Built-in full-color LCD display for real-time status and configuration
## Key Features
• Eliminates manual re-cabling between I-V and C-V test modes
• C-V measurement relocation to any device terminal without prober disruption
• Automated switching for transistor structure characterization
• User-configurable output channel naming and low-current capability options
• Bias tee support on all four channels for DC-biased AC signal delivery
## Typical Applications
• Semiconductor device research and development
• Parametric production testing
• Advanced material characterization
• Transistor and diode electrical analysis
## Compatibility & Integration
The 4200A-CVIV accepts up to four Source-Measure Units (4200-SMU, 4201-SMU, 4210-SMU, or 4211-SMU) and integrates with the 4210-CVU or 4215-CVU capacitance-voltage units. Operation requires a Keithley 4200A-SCS Parameter Analyzer mainframe.
