The Keysight E4727B Advanced Low-Frequency Noise Analyzer measures noise performance across 30 mHz to 100 MHz with sensitivity of -185 dBV²/Hz. This instrument characterizes flicker noise, random telegraph noise, and power spectral density in FETs, BJTs, diodes, and resistors under programmable bias conditions up to 200 V and 100 mA. Hardware averaging optimizes measurement throughput and accuracy, while a redesigned low-noise amplifier enables noise analysis at extremely low bias currents. High-power device characterization extends to 1 A operation. The analyzer integrates with PathWave WaferPro Express for automated wafer-level measurements, auto-prober control, and wafer mapping without programming. Measured data feeds directly into PathWave Model Builder and IC-CAP for device modeling workflows.
Technical Specifications
• Frequency range: 30 mHz to 100 MHz
• Voltage capability: Up to 200 V
• Current capability: Up to 100 mA (standard); up to 1 A for high-power devices
• Noise sensitivity: -185 dBV²/Hz
• Source and load impedances: 23 selectable values (0 Ω to 100 MΩ) with auto-selection
• Operating temperature: 10 to 40 °C
• Power input: 100 to 240 VAC, 50/60 Hz
• Dimensions: 298 mm × 192 mm × 104.3 mm; Weight: 8.9 kg
– Key Features
• Flicker (1/f) noise, random telegraph noise, and time-domain measurements
• Noise power spectral density analysis
• DC characteristic profiling
• Flexible hardware averaging for throughput-accuracy optimization
• Low-bias-current measurement via redesigned LNA
• Automated measurement and device type-based impedance selection
• PEL and Python scripting support
– Typical Applications
• Process design kit development
• Manufacturing statistical process control and device reliability
• IC noise specification and input-referred voltage noise characterization
• GaN and high-power device reliability assessment
– Compatibility & Integration
Bundled software includes W7802B measurement bundle (A-LFNA) and W7801B control software for Keysight B1530A WGFMU integration. Operates within PathWave WaferPro Express ecosystem with native support for automated wafer probing and device modeling workflows.
