The Keysight/Agilent/HP 3458A is an 8.5-digit multimeter designed for precision measurement across DC voltage, AC voltage (True RMS), resistance, DC current, AC current, frequency, and period. It delivers DC voltage accuracy of 8 ppm per year (4 ppm optional) with 10 nV sensitivity and 10 MΩ input impedance, establishing it as the standard in calibration laboratories, R&D, and manufacturing test environments.
The instrument combines exceptional accuracy with high-speed acquisition. At 4.5 digits, it captures 100,000 readings per second; at 5.5 digits, 50,000 readings per second; and at full 8.5-digit resolution, 6 readings per second. Its dual-path digitizing architecture supports both an integrating path (16–24 bit, 500 ns to 1 second aperture, low-noise operation) and a 12 MHz track-and-hold path (2 ns aperture, 100,000 samples/sec, 100 ps jitter, waveform capture).
Technical Specifications
Voltage & Current Measurement
• DC Voltage: 100 mV to 1000 V ranges; 0.0008% basic accuracy; 0.6 ppm 24-hour stability; 0.01 ppm RMS internal noise
• AC Voltage (True RMS): 10 mV to 1000 V; 1 Hz to 10 MHz bandwidth; 100 ppm mid-band accuracy
• DC Current: 100 nA to 1 A; 1 pA sensitivity; 14 ppm 24-hour accuracy
• AC Current: 100 μA to 1 A; 10 Hz to 100 kHz bandwidth; 500 ppm 24-hour accuracy
Resistance & Frequency
• Ohms: 10 Ω to 1 GΩ; 2-wire or 4-wire with offset compensation; 2.2 ppm 24-hour stability
• Frequency & Period: 1 Hz to 10 MHz (frequency), 100 ns to 1 sec (period); 0.01% accuracy
Digitizing Performance
• Resolution: 16 to 24 bits
• Sample Rate: Up to 100,000 samples/sec with 10 ns timing resolution
• Aperture Time: 500 ns to 1 second (integrating), 2 ns (track-and-hold)
• Jitter: <100 ps
– Key Features
• Linearity: 0.1 ppm; transfer accuracy 0.1 ppm
• Input impedance: 10 MΩ (voltage measurement)
• Current sensitivity: 1 pA (DC), 10 μA minimum (AC)
• Offset-compensated resistance on 10 Ω to 100 kΩ ranges
• Keysight Multimeter Language (ML) programming support
– Typical Applications
Calibration laboratories, precision research and development, manufacturing test environments, and high-reliability measurement verification.
– Compatibility & Integration
Designed for compatibility with previous multimeter models; supports ML for simplified instrument control and data automation.
