The Tektronix 370B High Resolution DC Programmable Curve Tracer performs comprehensive DC parametric characterization of semiconductor devices from picoampere to 20 A and millivolt to 2,000 V ranges. This instrument graphically displays voltage-current characteristics of transistors, diodes, SCRs, MOSFETs, integrated circuits, and solar cells, enabling precise device analysis in R&D, failure analysis, quality control, and manufacturing environments.
Technical Specifications
Sourcing & Measurement Range
• Collector supply voltage: 0 to 2,000 V maximum
• Collector current: Up to 20 A
• Measurement resolution: Down to 1 pA or 50 µV
• Collector supply accuracy: Within 0.1 DIV of horizontal graticule lines
• Collector current accuracy: Within 0.1 DIV vertical; cursor accuracy within 1.5% of readout + 0.1 DIV
Step Generator (Vbe)
• Range: 100 mV/DIV to 5 V/DIV (1-2-5 sequence)
• Amplitude: 50 mV to 2 V (six steps, 1-2-5 sequence)
• Offset control: –10 to +10 times step amplitude
• Step generator accuracy: Less than 1.5% of total output + 3% × step amplitude setting + 1 mV or 1 nA
Pulsed Step Generator
• Range: 1 mA to 2 A (1-2-5 sequence)
• Pulse width: 80 µs or 300 µs, ±10%
Current Source (Ic Range)
• Amplitude: 50 nA to 200 mA (21 steps, 1-2-5 sequence)
• Maximum collector current: 20× step amplitude setting; 10× when control set to 200 mA
• Short circuit current limiting: 500 mA, +50%, –20%
Power Supply Options
• 3 kW, 300 W peak: 100 mV/DIV to 5 V/DIV
• 30 W, 3 W peak: 50 V/DIV to 500 V/DIV
• 300 mW, 30 mW peak: 5 V/DIV to 50 V/DIV
• Variable collector supply: 0 to 100% of maximum peak voltage in 0.1% increments
Signal Integrity
• Looping compensation: At least 100 pF
• Ripple plus noise (collector supply): Within 1% of step amplitude + 10 mV
• Ripple plus noise (voltage mode): Less than 0.5% × step amplitude + 10 mV
• Step rates: 2× line frequency (1× in AC collector supply mode)
– Key Features
• Built-in cursor measurements for precise data point extraction
• Kelvin sense connections for accurate low-resistance measurements
• Store and recall test setups and curve data
• Maximum opposing offset current: 10× step amplitude
• Maximum opposing voltage: Less than 15 V
• Maximum opposing current: Less than 20 mA
• Minimum maximum collector voltage: 10 V
– Typical Applications
• Semiconductor device characterization and parametric testing
• Transistor and MOSFET curve analysis
• Diode and SCR evaluation
• Solar cell performance assessment
• Component failure analysis and quality verification
• Manufacturing test and process validation
– Compatibility & Integration
Programmable sourcing and measurement capabilities integrate into production test environments. Device programming enables automated test setup storage, setup recall, and curve data archiving for documentation and traceability.
