The Tektronix PPG3204 is a four-channel programmable pattern generator delivering up to 32 Gb/s per channel for high-speed digital device characterization and system testing. Each output channel operates independently with DC-coupled differential data outputs, enabling multi-lane test scenarios across 100 Gigabit Ethernet, 32G Fibre Channel, PAM4, and DP-QPSK applications. When paired with Tektronix PED series error detectors, the PPG3204 provides complete bit error rate (BER) test capability.
Technical Specifications
• Channels: 4 independent output channels
• Data Rate: Up to 32 Gb/s per channel; programmable from broad range including 32 Gb/s and 14 Gb/s
• Output Type: DC-coupled differential (CML, ground-referenced); single-ended and differential options available
• Output Amplitude: 300 mV to 1.0 V (differential); 250 mV to 2.0 V (single-ended); 500 mV to 4.0 V (differential alternative)
• Offset Range: -2 V to +3.0 V, programmable
• Termination Voltage Range: -2.0 V to +3.3 V, programmable/adjustable via 50 Ω user termination
• Output Impedance: 50 Ω
• Rise/Fall Times: 11 ps typical (20% to 80%)
• Crossing Point: 35% to 65% programmable
• Jitter (Data Output): 900 fsRMS typical (27-1 PRBS); random jitter < 250 fs typical
• Jitter Insertion: BUJ (up to 50 ps p-p, modulation to 2.5 Gb/s), SJ, RJ, PJ; low-frequency jitter 10 Hz to 10 MHz (up to 5000 UI)
• Pattern Generation: PRBS and user-defined patterns; 2 to 2,097,152 bits per channel (2 Mbits)
• Error Insertion: Single bit or programmable rate capable
• Pattern Bit Shift: ±(2^30 – 1) bits, independent per channel
• Clock Source: Built-in adjustable, 16 GHz to 32 GHz internal range
• Clock Output: 600 mVp-p typical, AC-coupled
– Key Features
• Independent channel programmability for flexible multi-lane testing
• Configurable output amplitude and offset across wide voltage windows
• Multiple jitter injection options including high-frequency and low-frequency modes
• Large pattern depth (2 Mbits per channel) with extended bit shift capability
• Precise timing control: 11 ps rise/fall times and programmable crossing points
– Typical Applications
• 100 Gigabit Ethernet characterization
• 32G Fibre Channel device testing
• PAM4 and DP-QPSK signal generation
• Multi-lane receiver validation
• Jitter tolerance and compliance testing
– Compatibility & Integration
Forms a complete BER test system when integrated with Tektronix PED series error detectors.
