The Emerson/Artesyn/Astec MP4-1D-1F-1F-1F-1Q-0M is a 400W configurable power supply engineered for industrial automation, telecommunications, and demanding commercial environments. Its modular architecture supports five output slots with field-proven reliability exceeding 550,000 hours MTBF at full load. The unit accepts wide-range AC (85–264 VAC) and DC (120–350 VDC) inputs, delivering precision-regulated outputs with 0.4% line/load regulation and 5 ms early warning before regulation loss
• Input Fuse: 10A
**Output Configuration (MP4-1D-1F-1F-1F-1Q-0M)**
• Slot 1 (1D): 3.3V @ 35A
• Slots 2–4 (1F each): 5.2V @ 35A per slot
• Slot 5 (1Q): 24V @ 8.5A
• Voltage Adjustment: ±10% minimum on all outputs
• Margining: ±4–6% nominal
• Regulation: 0.4% or 20 mV maximum
• Ripple (RMS): 0.1% or 10 mV, whichever is greater
• Ripple (Pk-Pk): 1.0% or 50 mV (20 MHz bandwidth limit)
• Dynamic Response: <2% or 100 mV on 25% load step
• Recovery Time: <300 µsec to 1% steady-state
**Environmental & Mechanical**
• Operating Temperature: −20 °C to 50 °C (linear derate to 50% at 70 °C; −20 °C to 40 °C with rear air option)
• Storage Temperature: −40 °C to 85 °C
• Humidity: 95% non-condensing
• Shock/Vibration: Mil-Hdbk 810E compliant
• Case Size: 2.5 × 5 × 10 inches
## Key Features
• Auto-recovery short-circuit protection on all outputs
• Overload protection on each channel
• Per-module voltage adjustment and margining capability
• Outputs adjustable down to 0.5V
• Harmonic distortion compliant with EN61000-3-2
• Power factor correction integrated
• Status indication via Input-OK and Global DC-OK LEDs
## Typical Applications
• Industrial automation control systems
• Telecommunications infrastructure
• Multi-rail embedded systems requiring isolated voltage domains
• Mission-critical equipment demanding high MTBF
## Compatibility & Integration
The five-slot architecture accepts single output modules in four power ranges, with support for series and parallel configurations. Individual module inhibit/enable control provides flexible load sequencing and margin testing.
