The Stanford Research Systems SR715 LCR Meter is a precision impedance measurement instrument for accurate characterization of passive components across a broad range of values. It measures inductance, capacitance, resistance, quality factor, and dissipation factor with 0.2% basic accuracy. The instrument supports both series and parallel equivalent circuit models, making it suitable for component testing, quality control, automated test systems, and benchtop applications.
Technical Specifications
Measurement Parameters & Ranges
• Resistance (R): 0.0001 Ω to 2000 MΩ
• Inductance (L): 0.0001 µH to 99999 H
• Capacitance (C): 0.0001 pF to 99999 µF
• Quality Factor (Q): 0.00001 to 50
• Dissipation Factor (D): 0.00001 to 10
• C+R mode: C from 0.0001 pF to 99999 µF; R from 0.0001 Ω to 99999 kΩ
Measurement Modes
Auto, R+Q, L+Q, C+D, C+R with selectable measurement rates of 2, 10, or 20 per second (at 1 kHz and above). At 100 Hz and 120 Hz, rates are approximately 0.6, 2.4, or 6 per second. Consecutive readings can be averaged 2 to 10 times.
Test Frequencies
100 Hz, 120 Hz, 1 kHz, 10 kHz with ±100 ppm accuracy.
Drive Voltage
Preset levels: 0.1 Vrms, 0.25 Vrms, 1.0 Vrms. Adjustable vernier from 0.1 Vrms to 1.0 Vrms in 50 mV increments with ±2% accuracy.
Bias Capability
Internal bias: 2.0 VDC ±2%. External bias: 0 to +40 VDC (fused at 0.25 A).
– Key Features
• 5-digit LED display showing measured values, deviation, percent deviation, or bin assignment
• Null calibration compensates for lead impedance, fixture, and cable capacitance
• Automatic open and short circuit correction at all frequencies and ranges
• Binning functionality: sorts components into up to ten bins for production testing and incoming inspection
– Typical Applications
Component matching, incoming inspection, production testing, device characterization, and passive component validation across industrial and laboratory environments.
– Compatibility & Integration
Rear-panel banana jacks accommodate external bias connections. Instrument accepts standard test fixtures and probes compatible with impedance measurement workflows.
